DEMO: PNA-X Spurious Test by Dr. Joel Dunsmore

Dr. Joel Dunsmore will guide you through a 20-minute demo showcasing optimized spurious testing using the enhanced PNA/PNA-X DDS source.

During this webinar, Dr. Dunsmore will demonstrate:

Dr. Joel Dunsmore

Keysight R&D Fellow

Since graduating from Oregon State University with an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent and Hewlett-Packard) at the Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is a Keysight R&D Fellow focused on component test. He was a principal contributor to the HP 8753 and PNA family of network analyzers, with recent work in non-linear test, including differential devices, and mixer measurements, as well as modulated and spectrum measurements. He was principally responsible for many of fundamental algorithm designs in the PNA applications including the frequency converter, spectrum-analyzer, gain compression, IQ, and Hot S-parameter measurements. He has received 33 patents related to this work, and authored the “Handbook of Microwave Component Measurements, 2nd Edition (John Wiley, 2020)”. He is a senior member in the IEEE and MTT, as well as an executive committee member of the Automated RF Techniques Group (ARFTG).

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