Dynamic Characterization of WBG Power Modules, Device Modeling, and Circuit Simulation

The dynamic characterization of wide bandgap (WGB) power modules has become more important to demonstrate their advantages such as low energy loss and fast switching. However, repeatability, reliability, and safety of the dynamic test have always been challenges. It has also been time-consuming to complete all tests and analyze all data, deteriorating engineers' productivity. In this session, we will present how our new dynamic test system PD1550A will overcome these challenges. We will also discuss device modeling and circuit simulation using the data taken by PD1552A.