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KEF 2: Next Gen Development in Type-C Ecosystem

Thu, Apr 7, 2022 · 8:55 AM · Pacific Time (US & Canada)
About This Webinar

During this Keysight Education Forum, we will cover the latest updates in the Type-C Ecosystem that includes USB, Display Port (DP), and Thunderbolt. You will learn the differences between testing Thunderbolt™ 3 & 4, USB4®, and DP 2.0, how to avoid pitfalls when testing next-gen type c technologies, and what happens after USB4.

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Featured Presenters
Webinar hosting presenter
Strategic Planner
Jit Lim has been enabling customers for over 33 years in Test and Measurement since graduating from MIT in 1986. He has published numerous technical papers and helped many world-wide customers characterize and validate their leading-edge designs. Today, Jit Lim is the Strategic Planner for the Keysight USB Type-C® Ecosystem Solutions.
Webinar hosting presenter
Senior Application Engineer, Keysight Technologies
Pegah Alavi is a Senior Applications Engineer at Keysight Technologies, where she focuses on Signal Integrity and High Speed Digital systems. Prior to joining Keysight, Pegah worked on behavioral and macro-modeling of analog and mixed signal circuits and components in her previous jobs.
Webinar hosting presenter
Solution Planner
Pedro Merlo joined Keysight in 2019 to lead the USB and DisplayPort solution planning and help world-wide customers overcome their signal integrity and testing challenges.
He is an active contributor to the USB Implementers Forum and the Video Electronics Standards Association and has broad experience in High-Speed Digital test, debug and characterization.
He holds BSc and MSc degrees in Telecommunication Engineering with a major in Software Engineering from the Technical University of Madrid.
Documents
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Slides Next-Gen Developments in the Type-C Ecosystem
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White Paper: What New Challenges Await High Speed Digital Designers?
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