Accelerating Semiconductor Innovation: From IC Design to Final Test

As semiconductor devices become more complex, engineering teams face increasing pressure to reduce development time while maintaining measurement accuracy, product quality, and reliability.

Join Keysight experts for this technical webinar to explore how integrated workflows can help accelerate semiconductor innovation from IC design through wafer-level characterization and final functional test. Through real-world use cases, you’ll learn how engineers can improve simulation-to-silicon correlation, streamline validation, automate measurements, and gain greater confidence throughout the development lifecycle.

Whether you’re designing RF circuits, characterizing devices on-wafer, or validating advanced photonic integrated circuits, discover practical approaches that help bring next-generation semiconductor products to market faster.

What You Will Learn

During this webinar, you’ll discover how to:

• Accelerate RF amplifier design through simulation and optimization

• Improve simulation-to-silicon correlation for faster validation

• Automate on-wafer parametric measurements for accurate device characterization

• Validate photonic integrated circuits using synchronized optical and electrical measurements

• Streamline semiconductor workflows from IC design through final functional test

• Reduce development risk while improving engineering confidence

Why Attend

See how integrated semiconductor workflows can help engineering teams:

• Reduce design iterations and validation time

• Improve measurement accuracy and repeatability

• Increase confidence in engineering decisions

• Accelerate time-to-market for advanced semiconductor devices

• Simplify complex measurement and test workflows across the semiconductor lifecycle

Reserve your spot today to learn how Keysight solutions help accelerate semiconductor innovation from design through validation and final test.