With expansion of high throughput applications such as emerging 6G communications, new high-resolution radars, and integrated sensing and communications, there is an expanded need to operate in sub-THz frequencies. While operation beyond 100 GHz enables wider bandwidths and smaller form factors, it also places greater demands on receiver performance and measurement accuracy — especially at the device and wafer level.

As a result, on‑wafer noise figure (NF) characterization has become a critical requirement for sub‑THz integrated circuits and front‑end components. However, conventional Y‑factor techniques are often impractical at D‑band and above due to excessive probe loss and large uncertainty contributions. 

In this webinar, you will learn how the cold-source noise figure method provides a practical and robust approach for on-wafer sub-THz measurements using frequency extenders and probe-based test setups.

What You’ll Learn:

• Why cold-source techniques are well suited for measurements beyond 100 GHz.

• How to perform receiver noise calibration in probe-based setups.

• How mismatch, IF bandwidth, and probe loss affect measurement accuracy.

• Which factors contribute most to overall noise figure uncertainty.

• Best practices for achieving repeatable and traceable on-wafer measurements.

• Practical workflows for characterizing LNAs and receiver front ends without high-ENR noise sources.

Real measurement examples will demonstrate how these techniques can be applied to improve confidence and repeatability when characterizing next-generation sub-THz devices.

Register now to learn practical methods for improving the accuracy and reliability of on-wafer noise figure measurements beyond 100 GHz.