Power Supply and Device Testing in the AI Era

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30 Minutes

AI workloads are placing new demands on power supplies and devices, changing how engineers approach validation and characterization. As systems scale for higher performance and lower power consumption, power delivery becomes a critical design challenge. Measurements such as ripple, offset, and switching behavior require greater precision - particularly in designs using wide-bandgap technologies like silicon carbide (SiC) and gallium nitride (GaN).

This webinar explores practical measurement approaches for validating power supplies and devices, especially in today’s AI-driven era. We will discuss how high vertical resolution, low-noise oscilloscopes with digital triggering can help engineers observe subtle power rail behavior, capture infrequent events, and gain confidence in their measurement results.

In this session, you will learn how to:

  • Address measurement gaps in low-voltage power rails using advanced probing techniques
  • Apply mask testing and digital triggering to catch infrequent events
  • Improve signal fidelity with high ENOB and low noise floor
  • Evaluate switching performance in next-generation power devices

The session includes a demonstration of key measurements that support faster, more reliable validation in AI-era designs.

Presenters

  • Celeste Rudd
    Product Marketing Engineer, Keysight Technologies
    Celeste earned an Electrical Engineering degree from Texas A&M University. She brings over three years of semiconductor experience to her role at Keysight. She defines global campaign strategies and creates technical content for customers. She collaborates with engineers and product teams to identify needs and drive success.

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Webinar: Power Supply and Device Testing in the AI Era by Keysight