Pro XG7 Live: Rethinking High-Performance, Higher-Density RF Tests

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When noise or spurs appear in an RF measurement, how much comes from your device, and how much comes from your signal source? As device performance advances, source impairments can limit what you can characterize and how confidently you can interpret the results.

Join Keysight product leaders and R&D engineers for a 30-minute introduction to the latest addition to the Pro XG7-class analog signal generator lineup. Get a live look at the new platform and learn how its architecture addresses phase noise, broadband noise, spurious content, output power, and test setup complexity.

Learn how to manage common RF test challenges:

  • Distinguish device behavior from noise and spurs introduced by the signal source.
  • Understand how yttrium iron garnet (YIG) architecture and direct digital synthesis (DDS) work together to control signal impairments.
  • Drive demanding device tests and compensate for test-path loss with clean, calibrated power up to +22 dBm.
  • Combine two independent RF sources in a 2U chassis to reduce rack space, cabling, and setup complexity.

Leave with a clear understanding of how the new Pro XG7 performs in real measurements and how to minimize source-generated limitations in RF device characterization.

Presenters

  • Deva Issa
    Product Marketing Manager - Keysight
  • John Ma
    General Manager, Signal Sources - Keysight
  • Brooks Hanley
    Application Engineer / Scientist - Keysight
  • Andy Ferrara
    Microwave Design Engineer / R&D - Keysight

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Webinar: Pro XG7 Live: Rethinking High-Performance, Higher-Density RF Tests by Keysight