As AI, cloud, and networking applications continue to drive the adoption of high-speed optical and electrical interconnects, validating interconnect performance requires more than traditional physical-layer measurements. Engineers must verify real-world digital-layer error performance across complete interconnect assemblies to ensure reliable deployment at scale.
Join Keysight product experts to explore the latest trends driving these new validation requirements. You'll learn about four key principles for next-generation interconnect testing, the critical measurements needed to accurately assess and ensure reliable system performance and how the new Keysight Functional Interconnect Test Solutions (FITS) portfolio enables and optimizes digital-layer BER and FEC error performance validation.
The webinar also includes a demonstration of an automated lane tuning technique using FITS with the Keysight DCA-M Sampling Oscilloscope. See how automated lane tuning dramatically improves signal integrity for the best possible BER and FEC error performance validation while increasing measurement consistency, reducing measurement uncertainty, and accelerating product development.
What you’ll learn: