: Nov 20, 2024
: 9:00 AM - Wednesday - November 20, 2024
A complimentary face-to-face technical RF seminar focusing on new test methodologies, measurement tips, applications, and industry trends.
Learn new measurement techniques, experience live demos, and discuss your test challenges with Keysight’s technical experts.
Refreshment and lunch are provided.
Agenda
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8:30 a.m.
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Registration
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9:00 a.m.
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Welcome
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9:15 a.m.
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Model, Simulate, and Optimize with EDA Software
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9:55 a.m.
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Noise Figure Measurement Techniques
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10:45 a.m.
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Break
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11:00 a.m.
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Modulation Distortion Analysis
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12:00 p.m.
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Lunch
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1:00 p.m.
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Optimizing EVM
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2:00 p.m.
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Break
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2:15 p.m.
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Phase Noise Measurement Techniques
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3:15 p.m.
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Hands-on and Q&A
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4:00 p.m.
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Conclusion
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Model, Simulate, and Optimize with EDA Software
This session introduces Keysight’s EDA software platform for the design of high-frequency components and systems—from single-purpose amplifiers to complex RF modules and phased array and beamforming subsystems. It offers a complete circuit design cycle, from circuit-level linear and non-linear simulations to physical design, layout, thermal simulations, and electromagnetic (EM) extractions. You will also learn how to verify circuit design with modulated waveforms (5G, WLAN, LTE, 3GPP, etc.) and plot important metrics such as EVM and ACLR using ADS.
On a system level, it allows you to evaluate phased array and beamforming subsystems, including RF, digital, and hybrid beamforming architectures. You can model phased array system channel-specific impairments, perform trade-off studies for cost-efficient design, and analyse active loading and scaling as well as load-pull effects.
Noise Figure Measurement
Noise figure is a crucial figure of merit for active devices that describes the signal-to-noise ratio degradation due to the device's added noise. Because minimizing noise figure reduces system impairments that result from noise, accurate noise figure measurements are crucial for system modeling in R&D and for tight guard bands in manufacturing.
Learn about noise figure and the two most common measurement methods: Y-factor and cold source. Our expert will also cover more accurate measurement approaches employed by Keysight VNAs, and calibration optimization and verification.
Modulation Distortion Analysis using Vector Network Analyzer
Learn how to use modulated-carrier measurements to characterize in-band and out-of-band DUT distortion using repetitive signals with the statistical characteristics of real-world signals. Keysight's unique frequency-domain method provides the lowest EVM floor compared to other approaches. I/Q data can also be streamed to vector-signal analysis software to show traditional constellation diagrams and other useful displays. The paper also covers using the modulation distortion application with passive and active load-pull setups.
Optimizing EVM
EVM is an essential metric for wideband transceivers, especially for higher-order QAM with dense constellations. Tighter EVM measurements are more critical than ever as the industry pushes for higher frequencies and wider bandwidths.
Learn how to optimize EVM using a signal generator and analyzer to achieve industry-best EVM for wideband, noise-dominated signals.
Phase Noise Measurement Techniques
In cutting-edge radar and communication systems, phase noise is the little-understood nemesis that limits system performance. Phase noise adversely affects a radar system's ability to process Doppler information and degrades EVM in digitally modulated communications systems. Wider use of complex digital modulation schemes brings greater susceptibility to poor phase noise performance.
For new and seasoned RF engineers, this paper will provide a fresh look at the basics of phase noise, how to measure it, and why it matters more than ever.
