Elevate Your Expertise with New Launch Next-Gen Testers

Join our online webinar as two RF experts guide you through optimizing testing method with our newly launch network analyzers and signal sources. Explore advanced features of the mid-range network analyzer, ENA-X, and learn about the benefits of the compact 4-port channel signal generator, MXG. Whether you're a seasoned pro or a keen leaner, this webinar promises valuable insights to reshape your RF testing practices.

To register, select one or more webinars, then submit the form to reserve your spot.

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Get a free Sandisk Ultra Dual Drive Go Type C 64G USB 3.1 flash drive when you invite your friends or colleagues to attend this webinar. 

Presenters

  • Takuya Hirato
    Senior Product Manager
    Taku Hirato is a product manager for Keysight Technologies' Communication Solution Group. He has 23 years’ experience in measurement applications for vector network analyzers. Taku started his career in R&D at Agilent Technologies in 2001, designing RF & microwave circuits. Since 2007, he has been an application development engineer and product manager for Keysight vector network analyzers. Taku received a Bachelor degree and Master’s degree of applied physics at Tohoku University, Japan in 1999 and 2001 respectively.
  • Yan Hua
    RF Specialist
    Yanhua Rui is a RF Specialist for Keysight Technologies' Communication Solution Group. She has 16 years’ experience in measurement applications for signal generation and signal analysis. Yanhua started her career as application engineer/customer education engineer focusing on digital video application of signal generator and signal analyzer at Agilent Technologies in 2008. Since 2014, She has been an application development engineer and product manager for Keysight signal generator and signal analyzer including LTE, PA Test, GNSS, noise figure, signal monitoring etc. applications.
    Yanhua received a Bachelor degree of Communications Engineering at Beijing Univ. of Posts and Telecommunications (BUPT) and a Master’s degree of Electronics Engineering at Tsinghua University, China in 2005 and 2008 respectively.

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Elevate Your Expertise with New Launch Next-Gen Testers