High Tech Campus Conference Center
High Tech Campus 1b
Eindhoven AE 5656
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High Tech Campus

What this event is about

A complimentary face-to-face technical RF seminar focusing on new test methodologies, measurement tips, applications, and industry trends. Live demo is included during the presentation.   

Presenters  
Gustaaf Sutorius, Solution Expert, Keysight 

Xavier Allart, Solution Expert, Keysight 

Time	Agenda
09:30 – 10:00	Coffee & Registration
10:00 – 10:30	Welcome & Introduction
10:30 – 11:15	Distortion testing on modulated carriers with VNAs
11:15 – 12:15	Precision Phase Noise, Jitter and VNA measurements  using the new SSA-X
12:15 ­– 13:00	Lunch
13:00 – 13:45	Optimizing EVM Measurements
13:45 – 14:45	Using Oscilloscopes for RF measurements
14:45 – 15:00	Break
15:00 – 15:15	FieldFox introduction and latest updates
15:15 – 16:00	Demo and Hands-on

Distortion testing on modulated carriers with Keysight VNAs 
Frequency converters are integral to most RF applications, including wireless-communications systems and in the transmit and receive portions of radar and electronic-warfare systems. Learn how a modern vector-network analyzer can be used for comprehensive testing of mixers and frequency converters, covering a broad range of measurements including modulated-carrier measurements for in-band and out-of-band distortion using repetitive signals with the statistical characteristics of real-world signals. 

Optimizing EVM   

EVM continues to be an important “measure of goodness” for wideband transceivers, especially for higher-order QAM with dense constellations. As the industry pushes higher in frequency and wider in bandwidth, tighter EVM measurements are more important than ever. Optimizing EVM involves both the signal generator and signal analyzer enabling users to achieve industry-best EVM for wideband, noise-dominated signals.

Precision Phase Noise, Jitter and VNA measurements using the new SSA-X 

Phase noise impacts signal quality and increases error rates in communications links. In this presentation we will first review briefly the fundamental theory of phase noise and current measurement techniques. Then we will explain, and demonstrate, how phase noise, jitter and VNA measurements are performed on the new SSA-X. Finally, we will discuss the block diagrams on how we have reduced the complexity for residual phase noise measurements, and phase noise measurements above 54 GHz (including D and E band).

Using Oscilloscopes for RF measurements 

We will demonstrate how to perform the following RF signal analysis using Keysight Oscilloscopes:  

• Adjacent channel power (ACP) measurements on vector modulated signals.  
• Spectrum emission mask measurements. 
• Error vector magnitude (EVM) and cross correlated EVM (ccEVM) measurements on WLAN signals. 
• RF pulse characterization such as rise-time, PRI, pulse width, and angle of arrival (AoA). 
• RF measurement reference plane relocation (de-embedding) with receiver calibrator (RCal). 

FieldFox introduction and latest updates  
FieldFox provides benchtop accuracy in a portable package. We will demonstrate how to use the FieldFox as a vector network analyzer (VNA), spectrum analyzer (SA), cable & antenna analyzer, EMI receiver, and 5G analyzer.