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13:00
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Registration
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14:00
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UGM 2024 Opening | Visit Exhibition
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| 15:00 |
Tech Talk 1: "Optimize Automated Test Capabilities with Keysight i3070 Solutions" Driven by the increasing complexity of electronics, during this session we will go through our roadmap and solutions for in-circuit test to enhance test accuracy and efficiency. Keysight ICT platforms offer significant benefits in terms of cost, reliability, and time efficiency, making it indispensable for competitive manufacturing.
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15:45
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Visit Exhibition
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| 16:00 |
Tech Talk 2: "Challenges in New Automotive Radar Applications & How to Manufacture them Cost Effectively" Learn about the latest technologies in automotive radar applications like 4D imaging radar and In-Cabin radar and how Keysight helps manufacturers produce them cost effectively via End-of-line test.
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16:45
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Visit Exhibition
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| 17:00 |
Tech Talk 3: "Lower Manufacturing Costs Via Test System Standardization in EV Applications" In the rapidly evolving electric vehicle (EV) industry, reducing manufacturing costs is crucial for competitiveness. This session explores the benefits of test system standardization in EV applications. Manufacturers can reduce production costs using new test methodologies that simplifies the testing process, enhancing efficiency. Additionally, a standardized solution accommodating multiple charging standards ensures compatibility and streamlines operations. These strategies collectively contribute to lower manufacturing costs and improved operational efficiency in the EV sector.
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17:45
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Visit Exhibition
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18:00
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Technical Debate: "Challenges and Opportunities on Dual Stage Testing and Fixturing" Have a panel discussion with Industry Leaders on Complex Board-Test applications that require Boundary Scan and Functional Test, the struggles to turn-on board’s internal regulators switching power supplies to complete all powered test sequence.
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18:45 |
Visit Exhibition |
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19:00
21:00
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Networking cocktail
Event ends |
