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From Lab to Fab: Innovations and Solutions in Wafer-Level Probing for 250 GHz and Silicon Photonics - Eindhoven

Wednesday, January 28, 2026

Registration: 08:30 h. | Event: From 09:00 to 17:30 h.

Keysight has introduced new millimeter-wave frequency extender modules that expand PNA-X Network Analyzer measurements up to 170 GHz and 250 GHz, supported by the 85065A 0.5 mm Precision Calibration Kit.

These compact extenders enable fully calibrated, single-sweep broadband S-parameter measurements from 100 kHz (or 10 MHz) to 250 GHz, simplifying high-frequency characterization while improving accuracy and repeatability.

Join us in this seminar to gain insights into the benefits of broadband frequency extension and how these solutions accelerate development in advanced RF and mmW systems.

Agenda
9:00 Opening - Geert Jan Hendriks (Microton)
9:15 Next-Generation Broadband Single Sweep DC-250GHz Probing System - James Hibbert (FormFactor)
10:15 New frequency extender up to 250 GHz - Xavier Allart (Keysight)
11:15 ModalCalibration and its benefits as a differential focused calibration algorithm - James Hibbert (FormFactor)
12:00 Lunch
13:00 Silicon Photonics Lab solutions - Kainoa Kekahuna (FormFactor)
14:00 Pharos: Enabling repeatable and automated edge coupling for wafer level testing - Ruby Singh (FormFactor)
14:45 Coffee Break
15:15 Triton - Silicon Photonics Production Test - Kainoa Kekahuna, Diwas Shrestha (FormFactor)
16:00 Closing
16:30 Networking with Drinks


By registering for this event, you acknowledge that your personal data will be collected and processed for event management purposes. Please review the data privacy policies of both Keysight Technologies and FormFactor to understand how your information will be handled and protected in accordance with applicable data protection laws.

Hosted by Keysight and FormFactor

From Lab to Fab: Innovations and Solutions in Wafer-Level Probing for 250 GHz and Silicon Photonics - Eindhoven