As AI and cloud infrastructure push performance boundaries, data center interconnect technologies are rapidly evolving toward 224G and 448G electrical and optical speeds. Ensuring reliable deployment requires more than component testing, it demands end‑to‑end validation across the entire ecosystem.
In this seminar, Keysight will demonstrate how to validate next‑generation interconnects, from IEEE 802.3 optical compliance to high‑speed digital interfaces such as DDR and PCIe. Discover how integrated test platforms, combining ultra‑high‑performance oscilloscopes, network test solutions, and data center emulation tools enable faster, more confident design and deployment of high‑speed systems.
| Agenda | |
|---|---|
| 9:00 | Registration |
| 9:30 | Welcome |
| 10:00 | The road from 224Gb to 448Gb: updates on the 802.3dj & challenges on the upcoming standards |
| 11:00 | Break |
| 11:15 | 224G measurements techniques |
| 12:00 | IEEE 802.3 optical validation |
| 12:45 | Lunch |
| 13:30 | The new XR8 oscilloscope introduction - Advanced performance for next gen signal analysis |
| 14:00 | Functional interconnect test solutions |
| 14:45 | Break |
| 15:00 | DDR, PCIe & UCIe in complex system designs |
| 15:45 | Closing session, knowledge test & prizes |
