Future communications infrastructure will shape society like never before. Virtual economies and digital twins of “everything” from production floors to entire workflows will bring visions like the Metaverse to life. From server to mobile end devices, new KPIs for this digital world experience and ubiquitous computing and communication will require a more than 1000-fold improvement in the performance of the communication infrastructure. However, these improvements will need to be within reasonable bounds of energy consumption and Co2-equivalent emission.
This session will discuss the challenges of network and data center performance improvements meeting cost and energy consumption targets. Universal Chiplet Interconnect Express (UCIe) that builds on an open ecosystem of chiplets for on-package innovations is one critical element towards that goal, that we will dive into. We will also discuss the vision of “The Innovative Optical and Wireless Network” (IOWN) Global Forum that will propel technologies in communication and network infrastructure to meet technological challenges and social needs. We will close the session with an outlook on the data center build out including the timelines for 800G and 1.6T deployments.

Presenters:
Joachim Peerlings, Keysight
Masahito Tomizawa, Nippon Telegraph and Telephone Corporation
Gerald Pasdast, Intel Corporation
Vladimir Kozlov, Lightcounting

This presentation covers Signal Integrity Simulation Flow for Differential High Speeds Interconnects (HSIO) such as PCIe® and USB. Three main areas will be discussed:
- Channel Design - focusing on getting a “clean” signal on printed circuit board (PCB) including channel optimization techniques. The performance of signal path is evaluated through the time-domain reflection (TDR) impedance plot, understanding of insertion loss as well as the reflection loss of the signal when it travels through the channel.
- End-to-end Simulation using ChannelSim – focusing on the setup of transmitter and receiver buffers using generic IBIS-AMI as well as observation of HSIO signaling margin such as eye height and eye width.
- Transient Simulation – targeting Signal and Power Integrity (SIPI) co-simulation for dual referencing design. The time-domain approach allows power noise injection to the simulation testbench and its noise coupling impact to HSIO will be observed.

Presenter: Li Wern Chew, Intel Microelectronics (M) Sdn. Bhd.

This session will provide an overview of DDR5/LPDDR5 technologies.
Various challenges on real test environment and JEDEC spec updates will be touched along with Keysight solution for design & validation during the session.

Presenter: Kar Hooi Kuan, Keysight

PAM4 is one of the most viable modulation approach to meet the strong demands of higher data rate. However this also creates huge engineering challenges.
In this webinar, we will share the basics of PAM4 technologies, the challenges and the latest PAM4 measurement solution that will help you in tackling these challenges.

Presenter: Brian Yeo, Keysight

Cloud services enabled by high performance datacenters continue to reach further into our lives, providing us services and insights once thought impossible. While these advances are clear to everyone, behind the scenes, the datacenter itself is undergoing a transformation as compute, storage, and memory resources are dissaggregated. An important technology enabling this disaggregation of datacenter resources is PCIe®. Having clear understanding and insight into how PCIe® is used in the datacenter, and the unique challenges of testing PCIe® protocol, as well as the protocols that leverage PCIe® such as NVMe™ and CXL, will be critical to building products and applications that can be deployed effectively in the disaggregated datacenter. This webinar, "PCIe® Protocol Test enables Datacenter Transformation" will examine how PCIe® is being deployed in the datacenter, and how different PCIe® use cases present protocol test challenges, and how best to address them through a solid PCIe® protocol test strategy.

Presenter: David Woolf, Keysight

Digital oscilloscopes have evolved over the years to offer a wealth of very advanced functions. On the other hand, unfortunately, many users feel that they have little use for their oscilloscope's functions. We have constantly heard from our customers that they want to improve their own measurement performance.
In this seminar, we will introduce basic but actually little-known functions as well as the latest advanced functions in an easy-to-understand manner. Also, as an application example, we will explain a debugging case in which a DDR problem that could not be solved for several months was solved with a new approach that had never been seen before in oscilloscopes.
We live in an age where measurement accuracy and speed are in high demand. We hope that Keysight users as well as oscilloscope users from other companies will learn measurement skills in this seminar to achieve more efficient evaluation and effective debugging than ever before.

Presenter: Wai Cheong Ng, Keysight

This webinar will introduce you to the changes and challenges going from USB 3.2 to USB4®. Also an introduction to Next-Gen USB and Type-C® technologies beyond USB4®. Plus other changes with USB-PD. We will show you how to successfully Electrical Test your USB4® products, coupled with pitfalls you can avoid.

Presenter: Jit Lim, Keysight