UL 1741 is the primary standard for certifying power conversion hardware for photovoltaic inverters in the United States and some other countries. This standard has evolved over the years, and now covers various types of equipment used in distributed energy resources (DER) applications, including the electric vehicle (EV) and photovoltaic inverter (PV) ecosystems.

UL vehicle-to-grid (V2G) standards expert Tim Zgonena will discuss the evaluation of safety standards for the rapidly growing DER and distributed energy resources (DER) industry.

Key Learning:

• Different equipment covered, from inverters to PV rapid shutdown systems
• Energy source types and products covered functionality
• Safety standards considerations for functional, electrical, and mechanical hazards
• And performance considerations

Tim will also cover the standards impacting energy storage systems and EV charging infrastructure as equipment evolves from single-directional to bi-directional use models.

Presenter: Timothy Zgonena, Underwriters Laboratories

The increasing number of electric vehicles (EVs) being used as intelligent distributed energy resources (DERs) offers an exciting opportunity for EV and EV supply equipment (EVSE) manufacturers to differentiate their products in the market. With the global adoption of bidirectional EV charging, and the addition of vehicle-to-grid (V2G) services, the EV battery pack goes from being just a consumer product that powers the vehicle, to being able to supply electricity back to the grid.
Energy providers (utilities) around the world enforce very strict rules and standard test requirements around DERs and their interconnection and interoperability with the grid. The various global EV charging standards make it even more complicated for EV and EVSE manufacturers to ensure global compliance of interconnection with the local grid. Join our panel of experts, who will dive into the design and test challenges posed by evolving V2G standards, and ways to solve these challenges.

Panel discussion :
Andrew Cifala / Jens Schmutzler / Wolfgang Kalthoff, Keysight
Moderator : Kevin Cavel, Keysight

Until now, doing EMI of simulations requires expertise in electromagnetics. In this training, we will discuss how to overcome this challenge via post-layout simulation using Keysight's power electronics simulation software.

Key Learnings:
• Overview of EMI challenges in switched-mode power supply design
• Post-layout simulations in design workflow
• Detect EMI problems early with Keysight’s PEPro

Presenter: Steven Lee, Keysight

The dynamic characterization of wide bandgap (WGB) power modules has become more important to demonstrate their advantages such as low energy loss and fast switching. However, repeatability, reliability, and safety of the dynamic test have always been challenges. It has also been time-consuming to complete all tests and analyze all data, deteriorating engineers' productivity. In this session, we will present how our new dynamic test system PD1550A will overcome these challenges. We will also discuss device modeling and circuit simulation using the data taken by PD1552A.

Presenter: Takamasa Arai, Keysight

To advance e-mobility, intensive testing of electric vehicle (EV) batteries is crucial. EV manufacturers, suppliers and test facilities need to make the best use of their battery test lab to ensure fast development. This presentation discusses ways of improving the efficiency in designing and operating your battery test lab.

Presenter: Stefan Dreifke, Keysight

Modern cars are getting more complex to enable better safety features, provide rich interactive infotainment, and improve overall vehicle responsiveness. The automotive industry is moving towards unified in-vehicle network standards to ensure component interoperability. Sony’s new image sensors push the bandwidth speeds higher, bringing with it challenges of signal integrity. We will explore the experiences and challenges Sony learned through our image sensor developments.

Presenter: Junichiro Azami, Sony Semiconductor Solutions Corporation

Keysight collaborates with Sony Semiconductor Solutions to help bring the industry’s vision of standardized automotive SerDes-based sensors to market. In addition, Keysight is the first test and measurement company to provide comprehensive design validation, debug and characterization solutions with an extensive range of tests for standards conformance of MIPI A-PHY and ASA. Learn more from our experts about Keysight’s newly launched SerDes receiver test solution, as well as the currently available transmitter and channel test solutions.

Presenter: Carrie Browen, Keysight
Demo : Kevin Kershner / Jae Yong Chang, Keysight

New obstacles have been added to new vehicle type certifications by UNECE WP.29 UN-R 155. Various aspects of this are being observed by OEMs, suppliers, test facilities, and technical services. With its SA8710A Automotive Cybersecurity Test Platform, Keysight has long offered a key to testing. To help our customers connect their requirements, TARA (Threat Analysis and Risk Assessment) results, and testing, now the attention to SA8710A is increasing. To properly operate a CSMS (Cyber Security Management System) according to ISO/SAE 21435 and keep the threat level low, having all the information in one location is essential.

Presenter: Seung-Taek Chang, Keysight

Vehicle-road-cloud collaboration accelerates the transformation and upgrading of vehicles in smart transportation. As one of the key supporting technologies, wireless communication have been applied on vehicles in serveral ways. In order to promote the forward R&D plan for wireless system that meets the requirements, CICV proposes a multi-level solution, including antenna design & optimization, system integration & co-existence design, link quality evaluation and function verification.

Presenter: Tai Huang, National Innovation Center of Intelligent and Connected Vehicle

Testing Application Layer performance is complex so testing in a Software In The Loop (SIL) enviroment will enable developers to test approx 80% of the functionality of a system. However, when real RF HW is introduced several factors come into play which need to be tested. Comparing KPI's in a SIL and then a HIL environment allows these factors to be tested.

Presenter: Bill McKinley, Keysight